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DIC 3D Optical Full Field Speckle Measurement System - Model 1

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DIC 3D Optical Full Field Speckle Measurement System - Model 2


 
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How it works:

VE Optics has developed a Digital Image Correlation (DIC) system that brings together the latest technologies and techniques that support a broad spectrum of customer needs and requirements. By using the latest high-resolution digital cameras and purpose driven software, VE Optics offers flexible yet powerful DIC solutions.

DIC is an optical method to measure displacement and deformation of objects. This method tracks the gray value pattern in small neighborhood subsets during the movement of certain points throughout the images before and after deformation. By calibration to test the scale of the images, the displacement of the objects can be obtained.

The VE Optics DIC systems support a non-contact real-time, high speed data collection solution, displaying the measurement of contour, deformation and strain. Our systems are supported by the highest level of application engineers that are ready to support your needs. 

 
 
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VE Optics DIC

VE Optics DIC system combines DIC technology and binocular stereo vision technology to realize the measurement of 3D coordinates, displacement field and strain field of the object surface in the process of deformation by tracking the speckle image of the object surface. DIC is a full-field, non-contact, 3D optical technique method to measure object’s contour, deformation, vibration and strain on material surface.

 
 
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APPLICATIONS

  • Material testing (Young’s modulus, Poisson’s ration, elastic-plastic parameters)

  • Components testing (measuring displacement and strain)

  • Bio mechanics (skeleton, muscle, blood vessel)

  • Microscopic morphology and stain analysis (micron and nano meter scale)

  • Fracture mechanical properties

  • Finite element analysis and verification

  • High speed deformation measurement (dynamic measurement, transient measurement)

  • Dynamic strain measurements, such as fatigue tests

  • Forming limit curve measurement